A Velyhan, J Krása, E Krouský, L Láska, D Margarone, M Pfeifer, K Rohlena, J Skála, J Ullschmied, A Lorusso, L Velardi, V Nassisi
Biblio references: Volume: 165 Issue: 6-10 Pages: 488-494
Origin: Radiation Effects & Defects in Solids: Incorporating Plasma Science & Plasma Technology